
DS3911
Temperature-Controlled, Nonvolatile,
I2C Quad DAC
17
Maxim Integrated
Lower Memory, Register 01h: MODE
Lower Memory, Register 02h: SRAM
POWER-ON VALUE
00h
ACCESS
R/W
MEMORY TYPE
Volatile
02h
SRAM
BIT 7
BIT 0
These general-purpose SRAM bits have no affect on device operation.
POWER-ON VALUE
40h
ACCESS
R/W
MEMORY TYPE
Volatile
01h
SEE
AEN
SRAM
SOFTTXD
BIT 7
BIT 0
BIT 7
SEE: Shadowed EEPROM Disable
0 = Enables EEPROM writes to the shadowed EEPROM bytes.
1 = Disables EEPROM writes to shadowed EPPROM bytes during configuration, so that the
configuration of the device is not delayed by the EEPROM cycle time. Once the values are known,
write this bit to a 0 and write the shadowed EEPROM locations again for data to be written to the
EEPROM.
BIT 6
AEN: Automatic Enable
0 = The temperature-calculated index value
TINDEX is writable by the user and the automatic
updates of calculated indexes are disabled. This allows users to interactively test their modules by
controlling the indexing for the LUTs. The recalled values from the LUTs appear in the
DAC VALUEregisters after the next completion of a temperature conversion.
1 = The internal temperature sensor determines the value of
TINDEX.
BITS 5:1
SRAM: General-Purpose SRAM. These bits have no affect on device operation.
BIT 0
SOFTTXD: Soft Transmit Disable
0 = DACs operate normally.
1 = The DAC outputs are forced to the bit value of the POL bit, which is located in the DAC’s
For example, when SOFTTXD is set and POL = 1 in the
DAC0 POR register, DAC0 is forced to full-
scale output, but if POL = 0, DAC0 is forced to a zero output. This applies to all four DACs.